Aehr Test Systems provides test solutions for testing, burning-in, and semiconductor devices in wafer level, singulated die, and package part form, and installed systems worldwide.
AEHR Test Systems’ burn-in equipment is designed to enable this process at scale, allowing for the simultaneous testing and burn-in of multiple chips or even wafer-level processes. Their solutions are used for both production and qualification testing of various semiconductor devices, ensuring that they meet the necessary quality and reliability standards before being incorporated into end-user products. Stock Chart